Multi-run Memory Tests for Pattern Sensitive Faults by Ireneusz Mrozek
Requirements: .PDF reader, 2,8 MB
Overview: This book describes efficient techniques for production testing as well as for periodic maintenance testing (specifically in terms of multi-cell faults) in modern semiconductor memory. The author discusses background selection and address reordering algorithms in multi-run transparent march testing processes. Formal methods for multi-run test generation and many solutions to increase their efficiency are described in detail. All methods presented ideas are verified by both analytical investigations and numerical simulations.
Genre: Non-Fiction > Tech & Devices
Download Instructions:
https://dailyuploads.net/g0ix10l9izsa
https://userscloud.com/5uy2ygau9v7j
Requirements: .PDF reader, 2,8 MB
Overview: This book describes efficient techniques for production testing as well as for periodic maintenance testing (specifically in terms of multi-cell faults) in modern semiconductor memory. The author discusses background selection and address reordering algorithms in multi-run transparent march testing processes. Formal methods for multi-run test generation and many solutions to increase their efficiency are described in detail. All methods presented ideas are verified by both analytical investigations and numerical simulations.
Genre: Non-Fiction > Tech & Devices
Download Instructions:
https://dailyuploads.net/g0ix10l9izsa
https://userscloud.com/5uy2ygau9v7j